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1、 Improper selection of current within the range

Due to improper selection of current range, more emphasis is placed on DC maintenance and harmonic vibration. If the current value required for essence is greater than the current value allowed by the film capacitor. This results in a heating effect for thin film capacitors and long-term high-temperature operation, greatly reducing the service life of thin film capacitors and causing a serious possibility of cracking or even combustion. In the configuration test, it is allowed to measure the peak current actually required through a special current probe or other methods, and then adjust the parameters of the capacitor.

The temperature rise of thin film capacitors can be measured by configuring the temperature rise of thin film capacitors in power degradation testing, and this parameter can be used to identify whether the selection of thin film capacitors is suitable for the allowable temperature rise parameter of thin film capacitors.

2、 Improper wire connection method

The key to improper wire connection lies in the application of multiple thin film capacitors in parallel circuits. Due to different wiring methods and intervals, the shunt of parallel thin film capacitors in electronic circuits varies.

The temperature rise of each thin film capacitor is different. The temperature rise of some membrane capacitors is too high, causing damage accidents Therefore, when thin film capacitors are operated in parallel, appropriate wiring and connections must be made to achieve the average value as much as possible and improve the service life of the thin film capacitors.

3、 Voltage exceeding the specified range

The most important aspect when the voltage exceeds the specified range is the harmonic vibration part. Developers should comprehensively consider parameters such as power supply configuration, input voltage, circuit topology, load magnetic permeability, and electronic circuit Q factor to develop a preliminary plan.

After reaching the conditions at the beginning of the prototype, basic measurements were taken on the electrical peak and series resonance parameters on both sides of the thin film capacitor, and it was further determined that the model and parameters of the thin film capacitor used were accurate.